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Sakari Sintonen
Sakari Sintonen
Leibniz Institute for Crystal Growth (IKZ)
Verified email at ikz-berlin.de
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Cited by
Cited by
Year
Aluminum oxide from trimethylaluminum and water by atomic layer deposition: The temperature dependence of residual stress, elastic modulus, hardness and adhesion
OME Ylivaara, X Liu, L Kilpi, J Lyytinen, D Schneider, M Laitinen, J Julin, ...
Thin Solid Films 552, 124-135, 2014
2012014
Thermal and plasma enhanced atomic layer deposition of SiO2 using commercial silicon precursors
M Putkonen, M Bosund, OME Ylivaara, RL Puurunen, L Kilpi, ...
Thin Solid Films 558, 93-98, 2014
902014
Preparation of deep UV transparent AlN substrates with high structural perfection for optoelectronic devices
C Hartmann, J Wollweber, S Sintonen, A Dittmar, L Kirste, S Kollowa, ...
CrystEngComm 18 (19), 3488-3497, 2016
802016
Defects in single crystalline ammonothermal gallium nitride
S Suihkonen, S Pimputkar, S Sintonen, F Tuomisto
Advanced Electronic Materials 3 (6), 1600496, 2017
552017
Aluminum oxide/titanium dioxide nanolaminates grown by atomic layer deposition: Growth and mechanical properties
OME Ylivaara, L Kilpi, X Liu, S Sintonen, S Ali, M Laitinen, J Julin, E Haimi, ...
Journal of Vacuum Science & Technology A 35 (1), 2017
492017
Diamond-like carbon (DLC) thin film bioelectrodes: Effect of thermal post-treatments and the use of Ti adhesion layer
T Laurila, A Rautiainen, S Sintonen, H Jiang, E Kaivosoja, J Koskinen
Materials Science and Engineering: C 34, 446-454, 2014
442014
Synchrotron radiation x-ray topography and defect selective etching analysis of threading dislocations in GaN
S Sintonen, M Rudziński, S Suihkonen, H Jussila, M Knetzger, E Meissner, ...
Journal of Applied Physics 116 (8), 2014
432014
X-ray reflectivity characterization of atomic layer deposition Al2O3/TiO2 nanolaminates with ultrathin bilayers
S Sintonen, S Ali, OME Ylivaara, RL Puurunen, H Lipsanen
Journal of Vacuum Science & Technology A 32 (1), 2014
402014
Thermal conductivity of amorphous Al2O3/TiO2 nanolaminates deposited by atomic layer deposition
S Ali, T Juntunen, S Sintonen, OME Ylivaara, RL Puurunen, H Lipsanen, ...
Nanotechnology 27 (44), 445704, 2016
322016
Effect of growth temperature on the epitaxial growth of ZnO on GaN by ALD
S Särkijärvi, S Sintonen, F Tuomisto, M Bosund, S Suihkonen, H Lipsanen
Journal of crystal growth 398, 18-22, 2014
242014
Incorporation and effects of impurities in different growth zones within basic ammonothermal GaN
S Sintonen, P Kivisaari, S Pimputkar, S Suihkonen, T Schulz, JS Speck, ...
Journal of Crystal Growth 456, 43-50, 2016
232016
Large-area analysis of dislocations in ammonothermal GaN by synchrotron radiation X-ray topography
S Sintonen, S Suihkonen, H Jussila, A Danilewsky, R Stankiewicz, ...
Applied Physics Express 7 (9), 091003, 2014
232014
Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon
L Kilpi, OME Ylivaara, A Vaajoki, J Malm, S Sintonen, M Tuominen, ...
Journal of Vacuum Science & Technology A 34 (1), 2016
212016
Mechanical and optical properties of as-grown and thermally annealed titanium dioxide from titanium tetrachloride and water by atomic layer deposition
OME Ylivaara, A Langner, X Liu, D Schneider, J Julin, K Arstila, ...
Thin Solid Films 732, 138758, 2021
202021
Nanotribological, nanomechanical and interfacial characterization of atomic layer deposited TiO2 on a silicon substrate
J Lyytinen, X Liu, OME Ylivaara, S Sintonen, A Iyer, S Ali, J Julin, ...
Wear 342, 270-278, 2015
182015
Analysis of threading dislocations in void shape controlled GaN re-grown on hexagonally patterned mask-less GaN
M Ali, AE Romanov, S Suihkonen, O Svensk, S Sintonen, M Sopanen, ...
Journal of crystal growth 344 (1), 59-64, 2012
172012
Evolution of impurity incorporation during ammonothermal growth of GaN
S Sintonen, S Wahl, S Richter, S Meyer, S Suihkonen, T Schulz, ...
Journal of Crystal Growth 456, 51-57, 2016
152016
Patterning of sapphire/GaN substrates
S Suihkonen, M Ali, O Svensk, S Sintonen, M Sopanen, H Lipsanen, ...
physica status solidi c 8 (5), 1509-1512, 2011
152011
An investigation of structural properties of GaN films grown on patterned sapphire substrates by MOVPE
PT Törmä, M Ali, O Svensk, S Sintonen, P Kostamo, S Suihkonen, ...
Physica B: Condensed Matter 404 (23-24), 4911-4915, 2009
152009
Defect structure of a free standing GaN wafer grown by the ammonothermal method
S Sintonen, S Suihkonen, H Jussila, H Lipsanen, TO Tuomi, E Letts, ...
Journal of crystal growth 406, 72-77, 2014
122014
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