| Spatial trends and historical deposition of mercury in eastern and northern Canada inferred from lake sediment cores DCG Muir, X Wang, F Yang, N Nguyen, TA Jackson, MS Evans, ... Environmental Science & Technology 43 (13), 4802-4809, 2009 | 220 | 2009 |
| Determination of graphene work function and graphene-insulator-semiconductor band alignment by internal photoemission spectroscopy R Yan, Q Zhang, W Li, I Calizo, T Shen, CA Richter, AR Hight-Walker, ... Applied Physics Letters 101 (2), 2012 | 219 | 2012 |
| Spectroscopic ellipsometry characterization of high-k dielectric thin films and the high-temperature annealing effects on their optical properties YJ Cho, NV Nguyen, CA Richter, JR Ehrstein, BH Lee, JC Lee Applied physics letters 80 (7), 1249-1251, 2002 | 202 | 2002 |
| Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study MP Seah, SJ Spencer, F Bensebaa, I Vickridge, H Danzebrink, M Krumrey, ... Surface and Interface Analysis: An International Journal devoted to the …, 2004 | 197 | 2004 |
| Exciton-dominated Dielectric Function of Atomically Thin MoS2 Films Y Yu, Y Yu, Y Cai, W Li, A Gurarslan, H Peelaers, DE Aspnes, ... Scientific reports 5 (1), 16996, 2015 | 187 | 2015 |
| Sub-bandgap defect states in polycrystalline hafnium oxide and their suppression by admixture of silicon NV Nguyen, AV Davydov, D Chandler-Horowitz, MM Frank Applied Physics Letters 87 (19), 2005 | 186 | 2005 |
| Broadband optical properties of large-area monolayer CVD molybdenum disulfide W Li, AG Birdwell, M Amani, RA Burke, X Ling, YH Lee, X Liang, L Peng, ... Physical Review B 90 (19), 195434, 2014 | 146 | 2014 |
| Structural, electronic, and dielectric properties of ultrathin zirconia films on silicon S Sayan, NV Nguyen, J Ehrstein, T Emge, E Garfunkel, M Croft, X Zhao, ... Applied Physics Letters 86 (15), 2005 | 131 | 2005 |
| Self-powered p-NiO/n-ZnO heterojunction ultraviolet photodetectors fabricated on plastic substrates MR Hasan, T Xie, SC Barron, G Liu, NV Nguyen, A Motayed, MV Rao, ... APL materials 3 (10), 2015 | 121 | 2015 |
| Direct measurement of Dirac point energy at the graphene/oxide interface K Xu, C Zeng, Q Zhang, R Yan, P Ye, K Wang, AC Seabaugh, HG Xing, ... Nano letters 13 (1), 131-136, 2013 | 93 | 2013 |
| Band offsets of atomic-layer-deposited Al2O3 on GaAs and the effects of surface treatment NV Nguyen, OA Kirillov, W Jiang, W Wang, JS Suehle, PD Ye, Y Xuan, ... Applied Physics Letters 93 (8), 2008 | 90 | 2008 |
| Interfacial properties of on silicon YS Lin, R Puthenkovilakam, JP Chang, C Bouldin, I Levin, NV Nguyen, ... Journal of Applied Physics 93 (10), 5945-5952, 2003 | 85 | 2003 |
| Spectroscopic ellipsometry determination of the properties of the thin underlying strained Si layer and the roughness at SiO2/Si interface NV Nguyen, D Chandler‐Horowitz, PM Amirtharaj, JG Pellegrino Applied physics letters 64 (20), 2688-2690, 1994 | 84 | 1994 |
| Broadband optical properties of graphene by spectroscopic ellipsometry W Li, G Cheng, Y Liang, B Tian, X Liang, L Peng, ARH Walker, ... Carbon 99, 348-353, 2016 | 83 | 2016 |
| Demonstration of In 0.9 Ga 0.1 As/GaAs 0.18 Sb 0.82 near broken-gap tunnel FET with I ON= 740μA/μm, G M= 70μS/μm and gigahertz switching performance at V Ds= 0.5 V R Bijesh, H Liu, H Madan, D Mohata, W Li, NV Nguyen, D Gundlach, ... 2013 IEEE International Electron Devices Meeting, 28.2. 1-28.2. 4, 2013 | 77 | 2013 |
| Determination of the optical constants of ZnSe films by spectroscopic ellipsometry R Dahmani, L Salamanca‐Riba, NV Nguyen, D Chandler‐Horowitz, ... Journal of applied physics 76 (1), 514-517, 1994 | 70 | 1994 |
| Optical band gaps and composition dependence of hafnium–aluminate thin films grown by atomic layer chemical vapor deposition NV Nguyen, S Sayan, I Levin, JR Ehrstein, IJR Baumvol, C Driemeier, ... Journal of Vacuum Science & Technology A 23 (6), 1706-1713, 2005 | 65 | 2005 |
| A solution-processed high-efficiency p-NiO/n-ZnO heterojunction photodetector R Debnath, T Xie, B Wen, W Li, JY Ha, NF Sullivan, NV Nguyen, ... Rsc Advances 5 (19), 14646-14652, 2015 | 55 | 2015 |
| Neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry characterization of thin on Si JA Dura, CA Richter, CF Majkrzak, NV Nguyen Applied physics letters 73 (15), 2131-2133, 1998 | 55 | 1998 |
| Effect of nitrogen on band alignment in HfSiON gate dielectrics S Sayan, NV Nguyen, J Ehrstein, JJ Chambers, MR Visokay, ... Applied Physics Letters 87 (21), 2005 | 50 | 2005 |
