Fangming Ye
Fangming Ye
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TSV open defects in 3D integrated circuits: Characterization, test, and optimal spare allocation
F Ye, K Chakrabarty
DAC Design Automation Conference 2012, 1024-1030, 2012
1152012
Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting
F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
842013
TSV defects and TSV-induced circuit failures: The third dimension in test and design-for-test
K Chakrabarty, S Deutsch, H Thapliyal, F Ye
2012 IEEE International Reliability Physics Symposium (IRPS), 5F. 1.1-5F. 1.12, 2012
752012
On effective and efficient in-field TSV repair for stacked 3D ICs
L Jiang, F Ye, Q Xu, K Chakrabarty, B Eklow
Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013
422013
Board-level functional fault diagnosis using multikernel support vector machines and incremental learning
F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
412014
Representative critical-path selection for aging-induced delay monitoring
F Firouzi, F Ye, K Chakrabarty, MB Tahoori
2013 IEEE International Test Conference (ITC), 1-10, 2013
342013
Aging-and variation-aware delay monitoring using representative critical path selection
F Firouzi, F Ye, K Chakrabarty, MB Tahoori
ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (3 …, 2015
292015
Adaptive board-level functional fault diagnosis using decision trees
F Ye, Z Zhang, K Chakrabarty, X Gu
2012 IEEE 21st Asian Test Symposium, 202-207, 2012
292012
Efficient board-level functional fault diagnosis with missing syndromes
S Jin, F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
182015
Test and design-for-testability solutions for 3D integrated circuits
K Chakrabarty, M Agrawal, S Deutsch, B Noia, R Wang, F Ye
IPSJ Transactions on System LSI Design Methodology 7, 56-73, 2014
182014
On-chip droop-induced circuit delay prediction based on support-vector machines
F Ye, F Firouzi, Y Yang, K Chakrabarty, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
172015
On-chip voltage-droop prediction using support-vector machines
F Ye, F Firouzi, Y Yang, K Chakrabarty, MB Tahoori
2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014
172014
Board-level functional fault diagnosis using learning based on incremental support-vector machines
F Ye, Z Zhang, K Chakrabarty, X Gu
2012 IEEE 21st Asian Test Symposium, 208-213, 2012
132012
Re-using BIST for circuit aging monitoring
F Firouzi, F Ye, A Vijayan, A Koneru, K Chakrabarty, MB Tahoori
2015 20th IEEE European Test Symposium (ETS), 1-2, 2015
112015
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis
F Ye, Z Zhang, K Chakrabarty, X Gu
2014 International Test Conference, 1-10, 2014
112014
Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis
F Ye, Z Zhang, K Chakrabarty, X Gu
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
112013
Adaptive board-level functional fault diagnosis using incremental decision trees
F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
72015
Information-theoretic framework for evaluating and guiding board-level functional-fault diagnosis
F Ye, K Chakrabarty, Z Zhang, X Gu
IEEE Design & Test of Computers, 65-75, 2014
62014
Fine-grained adaptive testing based on quality prediction
M Liu, R Pan, F Ye, X Li, K Chakrabarty, X Gu
ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020
52020
Information-theoretic syndrome evaluation, statistical root-cause analysis, and correlation-based feature selection for guiding board-level fault diagnosis
F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE transactions on computer-aided design of integrated circuits and …, 2015
52015
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Articles 1–20