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Ivan Kostic
Ivan Kostic
Senior researcher
Verified email at savba.sk
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Cited by
Year
MgB2 superconducting thin films on Si and Al2O3 substrates
A Plecenik, L Satrapinsky, P Kúš, Š Gaži, Š Beňačka, I Vavra, I Kostič
Physica C: Superconductivity 363 (4), 224-230, 2001
722001
Nb-Ti/Al/Ni/Au based ohmic contacts to AlGaN/GaN
G Vanko, T Lalinský, Ž Mozolová, J Liday, P Vogrinčič, A Vincze, F Uherek, ...
Vacuum 82 (2), 193-196, 2007
482007
Micromachined membrane structures for pressure sensors based on AlGaN/GaN circular HEMT sensing device
T Lalinský, P Hudek, G Vanko, J Dzuba, V Kutiš, R Srnánek, P Choleva, ...
Microelectronic Engineering 98, 578-581, 2012
342012
Wet-etch bulk micromachining of (100) InP substrates
P Eliáš, I Kostič, J Šoltýs, S Hasenöhrl
Journal of Micromechanics and Microengineering 14 (8), 1205, 2004
322004
Ohmic resistance of thin yttria stabilized zirconia film and electrode–electrolyte contact area
F Kundracik, M Hartmanova, J Müllerová, M Jergel, I Kostič, R Tucoulou
Materials Science and Engineering: B 84 (3), 167-175, 2001
252001
AlGaN/GaN based SAW-HEMT structures for chemical gas sensors
T Lalinský, I Rýger, G Vanko, M Tomáška, I Kostič, S Haščík, M Vallo
Procedia Engineering 5, 152-155, 2010
232010
Impact of SF6 plasma treatment on performance of AlGaN/GaN HEMT
G Vanko, T Lalinský, Š Haščík, I Rýger, Ž Mozolová, J Škriniarová, ...
Vacuum 84 (1), 235-237, 2009
232009
Epitaxial growth of low-resistivity RuO2 films on (1102)-oriented Al2O3 substrate
K Fröhlich, D Machajdı́k, V Cambel, I Kostič, S Pignard
Journal of crystal growth 235 (1-4), 377-383, 2002
222002
Thermo-mechanical characterization of micromachined GaAs-based thermal converter using contactless optical methods
T Lalinský, M Držík, J Chlpík, M Krnáč, Š Haščík, Ž Mozolová, I Kostič
Sensors and Actuators A: Physical 123, 99-105, 2005
192005
Fabrication of a vector Hall sensor for magnetic microscopy
D Gregušová, V Cambel, J Fedor, R Kúdela, J Šoltýs, T Lalinský, I Kostič, ...
Applied physics letters 82 (21), 3704-3706, 2003
192003
Directly sputtered stress-compensated carbon protective layer for silicon stencil masks
P Hudek, P Hrkut, M Držik, I Kostič, M Belov, J Torres, J Wasson, JC Wolfe, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
171999
Switching Magnetization Magnetic Force Microscopy—An Alternative to Conventional Lift-Mode MFM
V Cambel, D Gregušová, P Eliáš, J Fedor, I Kostič, J Maňka, P Ballo
Journal of Electrical Engineering 62 (1), 37-43, 2011
162011
Fabrication of GaAs symmetric pyramidal mesas prepared by wet-chemical etching using AlAs interlayer
S Kicin, V Cambel, M Kuliffayová, D Gregušová, E Kováčová, J Novák, ...
Journal of applied physics 91 (2), 878-880, 2002
162002
Network formation of a phenyl vinyl ketone copolymer with 4‐vinylbenzil and its photodecrosslinking in films
J Mosnáček, I Lukáč, Š Chromik, I Kostič, P Hrdlovič
Journal of Polymer Science Part A: Polymer Chemistry 42 (3), 765-771, 2004
152004
Structural characterization of a lamellar W/Si multilayer grating
M Jergel, P Mikulık, E Majková, Š Luby, R Senderák, E Pinčı́k, M Brunel, ...
Journal of applied physics 85 (2), 1225-1227, 1999
141999
GaAs based micromachined thermal converter for gas sensors
T Lalinský, M Držík, J Jakovenko, G Vanko, Ž Mozolová, Š Haščík, ...
Sensors and Actuators A: Physical 142 (1), 147-152, 2008
132008
Transfer of single-layer positive resist sub-micrometer and nanometer structures into silicon
IW Rangelow, Z Borkowicz, P Hudek, I Kostič
Microelectronic engineering 25 (1), 49-66, 1994
121994
Gadolinium scandate: next candidate for alternative gate dielectric in CMOS technology?
K Fröhlich, J Fedor, I Kostič, J Maňka, P Ballo
Journal of Electrical Engineering 62 (1), 54-56, 2011
112011
Micromachining of mesa and pyramidal-shaped objects in (1 0 0) InP substrates
P Eliáš, J Martaus, J Šoltýs, I Kostič
Journal of Micromechanics and Microengineering 15 (5), 1007, 2005
112005
Technology and properties of a vector hall sensor
D Gregušová, P Eliáš, Z Oszi, R Kúdela, J Šoltýs, J Fedor, V Cambel, ...
Microelectronics journal 37 (12), 1543-1546, 2006
102006
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