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Aliasghar Keyvani Janbahan (Sasan)
Aliasghar Keyvani Janbahan (Sasan)
Design engineer at ASML.
Verified email at asml.com
Title
Cited by
Cited by
Year
Pull-in phenomena and dynamic response of a capacitive nano-beam switch
F Vakili-Tahami, H Mobki, AA Keyvani-Janbahan, G Rezazadeh
Sensors & Transducers 110 (11), 26, 2009
342009
On the modeling of a piezoelectrically actuated microsensor for simultaneous measurement of fluids viscosity and density
G Rezazadeh, M Ghanbari, I Mirzaee, A Keyvani
Measurement 43 (10), 1516-1524, 2010
332010
Nonlinear behavior of a nano-scale beam considering length scale-parameter
H Mobki, MH Sadeghi, G Rezazadeh, M Fathalilou, A Keyvani
Applied Mathematical Modelling 38 (5-6), 1881-1895, 2014
282014
On a MEMS based dynamic remote temperature sensor using transverse vibration of a bi-layer micro-cantilever
G Rezazadeh, A Keyvani, S Jafarmadar
Measurement 45 (3), 580-589, 2012
272012
Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers
A Keyvani, H Sadeghian, MS Tamer, JFL Goosen, F van Keulen
Journal of Applied Physics 121 (24), 2017
222017
Simultaneous AFM nano-patterning and imaging for photomask repair
A Keyvani, MS Tamer, MH van Es, H Sadeghian
Metrology, Inspection, and Process Control for Microlithography XXX 9778 …, 2016
112016
Transient tip-sample interactions in high-speed AFM imaging of 3D nano structures
A Keyvani, H Sadeghian, H Goosen, F van Keulen
Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015
82015
A comprehensive model for transient behavior of tapping mode atomic force microscope
A Keyvani, MS Tamer, JW van Wingerden, JFL Goosen, F van Keulen
Nonlinear Dynamics 97, 1601-1617, 2019
72019
Chaos: the speed limiting phenomenon in dynamic atomic force microscopy
A Keyvani, F Alijani, H Sadeghian, K Maturova, H Goosen, F Van Keulen
Journal of Applied Physics 122 (22), 2017
72017
Modeling of a bio sensor based on detection of antigens concentration using an electrically actuated micro cantilever
H Madinei, AA Keyvani-Janbahan, M Atashparva, R Shabani, ...
Sensors & Transducers 125 (2), 238, 2011
62011
On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy
A Keyvani, H Sadeghian, H Goosen, F Van Keulen
Applied Physics Letters 112 (16), 2018
42018
Quantitative measurement of tip-sample interaction forces in tapping mode atomic force microscopy
S Tamer, HS Marnani, SK Janbahan, H Goosen, F van Keulen
13th International Workshop on Nanomechanical Sensing, 2016
42016
Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system therefore
HS Marnani, AK Janbahan
US Patent 10,697,998, 2020
32020
Real-time estimation of the tip-sample interactions in tapping mode atomic force microscopy with a regularized Kalman filter
A Keyvani, G van der Veen, MS Tamer, H Sadeghian, H Goosen, ...
IEEE Transactions on Nanotechnology 19, 274-283, 2020
32020
Effects of ohmic resistance on dynamic characteristics and impedance of micro/nano cantilever beam resonators
G Rezazadeh, A Keyvani, MH Sadeghi, M Bahrami
Sensing and Imaging: An International Journal 14, 1-12, 2013
32013
Effects of squeeze film damping on a clamped-clamped beam MEMS filter
A Keyvani, MH Sadeghi, G Rezazadeh, M Bahrami
Journal of Micro-Bio Robotics 8, 83-90, 2013
32013
First results from the large dynamic range atomic force microscope for overlay metrology
G Witvoet, J Peters, S Kuiper, S Keyvani, R Willekers
Metrology, Inspection, and Process Control for Microlithography XXXIII 10959 …, 2019
22019
Investigation of squeeze film effect on dynamic characteristics of electrically actuated fully clamped micro-beam
AAK Janbahan, A Ghanbari, J Keyghobadi
Sensors & Transducers 123 (12), 41, 2010
22010
Method of modifying a surface of a sample, and a scanning probe microscopy system
HS Marnani, AK Janbahan, MS Tamer, K Maturova
US Patent App. 16/347,922, 2019
12019
Improved sub-surface AFM using photothermal actuation
ME Reijzen, MS Tamer, MH Es, M Riel, A Keyvani, H Sadeghian, ...
Metrology, Inspection, and Process Control for Microlithography XXXIII 10959 …, 2019
12019
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