| Toward increasing FPGA lifetime S Srinivasan, R Krishnan, P Mangalagiri, Y Xie, V Narayanan, MJ Irwin, ... IEEE Transactions on Dependable and Secure Computing 5 (2), 115-127, 2008 | 110 | 2008 |
| A low-power phase change memory based hybrid cache architecture P Mangalagiri, K Sarpatwari, A Yanamandra, VK Narayanan, Y Xie, ... Proceedings of the 18th ACM Great Lakes symposium on VLSI, 395-398, 2008 | 86 | 2008 |
| FLAW: FPGA lifetime awareness S Srinivasan, P Mangalagiri, Y Xie, N Viiaykrishnan, K Sarpatwari 2006 43rd ACM/IEEE Design Automation Conference, 630-635, 2006 | 74 | 2006 |
| Extracting the Richardson constant: Schottky diodes K Sarpatwari, OO Awadelkarim, MW Allen, SM Durbin, SE Mohney Applied physics letters 94 (24), 242110, 2009 | 43 | 2009 |
| Temperature-dependent properties of nearly ideal ZnO Schottky diodes MW Allen, X Weng, JM Redwing, K Sarpatwari, SE Mohney, ... IEEE transactions on electron devices 56 (9), 2160-2164, 2009 | 41 | 2009 |
| Effects of barrier height inhomogeneities on the determination of the Richardson constant K Sarpatwari, SE Mohney, OO Awadelkarim Journal of Applied Physics 109 (1), 014510, 2011 | 27 | 2011 |
| Comprehensive understanding on the role of tunnel oxide top nitridation for the reliability of nanoscale flash memory T Kim, K Sarpatwari, S Koka, H Wang IEEE Electron Device Letters 34 (3), 396-398, 2013 | 19 | 2013 |
| Extracting the Schottky barrier height from axial contacts to semiconductor nanowires K Sarpatwari, NS Dellas, OO Awadelkarim, SE Mohney Solid-state electronics 54 (7), 689-695, 2010 | 19 | 2010 |
| Tunnel Oxide Nitridation Effect on the Evolution of Instabilities (RTS/QED) and Defect Characterization for Sub-40-nm Flash Memory T Kim, D He, K Morinville, K Sarpatwari, B Millemon, A Goda, J Kessenich IEEE electron device letters 32 (8), 999-1001, 2011 | 15 | 2011 |
| Modified three terminal charge pumping technique applied to vertical transistor structures LJ Passmore, K Sarpatwari, SA Suliman, OO Awadelkarim, R Ridley, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005 | 13 | 2005 |
| Disturb verify for programming memory cells K Sarpatwari, A Goda US Patent 8,638,607, 2014 | 11 | 2014 |
| Toward understanding the electrical properties of metal/semiconductor Schottky contacts: The effects of barrier inhomogeneities and geometry in bulk and nanoscale structures K Sarpatwari The Pennsylvania State University, 2009 | 11 | 2009 |
| Voltage stabilizing for a memory cell array K Sarpatwari, H Wang, R Sanjay US Patent 9,196,357, 2015 | 8 | 2015 |
| Fowler–Nordheim and hot carrier reliabilities of U-shaped trench-gated transistors studied by three terminal charge pumping LJ Passmore, K Sarpatwari, SA Suliman, OO Awadelkarim, R Ridley, ... Thin solid films 504 (1-2), 302-306, 2006 | 8 | 2006 |
| Analysis of current–voltage–temperature characteristics in SiC Schottky diodes using threshold-accepting simulated-annealing techniques K Sarpatwari, L Passmore, SA Suliman, OO Awadelkarim Solid-state electronics 51 (5), 644-649, 2007 | 6 | 2007 |
| Minority carrier injection limited current in Re/4H‐SiC Schottky diodes K Sarpatwari, SE Mohney, S Ashok, OO Awadelkarim physica status solidi (a) 207 (6), 1509-1513, 2010 | 5 | 2010 |
| Methods for generating random data using phase change materials and related devices and systems K Sarpatwari, H Wang, S Rangan US Patent 9,575,727, 2017 | 2 | 2017 |
| Data-based polarity write operations K Sarpatwari, NN Gajera, H Wang, M Cui US Patent 11,139,034, 2021 | 1 | 2021 |
| Memory element for weight update in a neural network K Sarpatwari, F Pellizzer US Patent App. 16/542,975, 2021 | 1 | 2021 |
| Techniques for applying multiple voltage pulses to select a memory cell JT Hamada, M Cui, JM McCrate, K Sarpatwari, J Chen US Patent 10,867,671, 2020 | 1 | 2020 |
