Thomas Hedberg Jr
Thomas Hedberg Jr
University of Maryland Applied Research Laboratory for Intelligence and Security (ARLIS)
Verified email at umd.edu - Homepage
Title
Cited by
Cited by
Year
Testing the Digital Thread in Support of Model-Based Manufacturing and Inspection
TD Hedberg Jr., J Lubell, L Fischer, L Maggiano, A Barnard Feeney
Journal of Computing and Information Science in Engineering 16 (2), 2016
762016
A survey of the advancing use and development of machine learning in smart manufacturing
M Sharp, R Ak, T Hedberg Jr
Journal of manufacturing systems 48, 170-179, 2018
702018
Enabling Smart Manufacturing Research and Development using a Product Lifecycle Test Bed
M Helu, T Hedberg Jr
Procedia Manufacturing, 2015
672015
Identified research directions for using manufacturing knowledge earlier in the product life cycle
TD Hedberg Jr, NW Hartman, P Rosche, K Fischer
International journal of production research 55 (3), 819-827, 2017
402017
Towards a Lifecycle Information Framework and Technology in Manufacturing
T Hedberg Jr, A Barnard Feeney, M Helu, J Camelio
Journal of Computing and Information Science in Engineering, 2016
382016
Reference architecture to integrate heterogeneous manufacturing systems for the digital thread
M Helu, T Hedberg Jr, AB Feeney
CIRP journal of manufacturing science and technology 19, 191-195, 2017
362017
Promoting Model-Based Definition to Establish a Complete Product Definition
SP Ruemler, KE Zimmerman, NW Hartman, T Hedberg, ...
Journal of Manufacturing Science and Engineering 139 (5), 051008-051008-7, 2016
352016
Toward knowledge management for smart manufacturing
SC Feng, WZ Bernstein, T Hedberg, A Barnard Feeney
Journal of computing and information science in engineering 17 (3), 2017
322017
Gaps analysis of integrating product design, manufacturing, and quality data in the supply chain using model-based defintion
A Trainer, T Hedberg Jr, A Barnard Feeney, K Fischer, P Rosche
International Manufacturing Science and Engineering Conference 49903 …, 2016
242016
Interoperability: linking design and tolerancing with metrology
E Morse, S Heysiattalab, A Barnard-Feeney, T Hedberg Jr
Procedia Cirp 43, 13-16, 2016
192016
A standards-based approach for linking as-planned to as-fabricated product data
M Helu, A Joseph, T Hedberg Jr
CIRP Annals 67 (1), 487-490, 2018
182018
Towards Identifying the Elements of a Minimum Information Model for Use in a Model-Based Definition
AMD Miller, NW Hartman, T Hedberg, A Barnard Feeney, J Zahner
ASME 2017 12th International Manufacturing Science and Engineering …, 2017
182017
Contextualising manufacturing data for lifecycle decision-making
WZ Bernstein, TD Hedberg Jr, M Helu, AB Feeney
International journal of product lifecycle management 10 (4), 326-347, 2017
172017
Embedding X.509 Digital Certificates in Three-Dimensional Models for Authentication, Authorization, and Traceability of Product Data
T Hedberg Jr, S Krima, J Camelio
Journal of Computing and Information Science in Engineering, 2016
172016
Investigating the Impact of Standards-Based Interoperability for Design to Manufacturing and Quality in the Supply Chain
K Fischer, P Rosche, A Trainer, AB Feeney, TD Hedberg
http://dx.doi.org/10.6028/NIST.GCR.15-1009, 2015
152015
System lifecycle handler—spinning a digital thread for manufacturing
M Bajaj, T Hedberg Jr
INCOSE International Symposium 28 (1), 1636-1650, 2018
102018
A standards and technology roadmap for scalable distributed manufacturing systems
T Hedberg Jr, M Helu, T Sprock
International Manufacturing Science and Engineering Conference 51371 …, 2018
102018
Design and configuration of the smart manufacturing systems test bed
T Hedberg Jr, T Hedberg Jr, M Helu
US Department of Commerce, National Institute of Standards and Technology, 2017
62017
Using graphs to link data across the product lifecycle for enabling smart manufacturing digital threads
TD Hedberg, M Bajaj, JA Camelio
Journal of Computing and Information Science in Engineering 20 (1), 2020
52020
Method for Enabling a Root of Trust in Support of Product Data Certification and Traceability
TD Hedberg, S Krima, JA Camelio
Journal of computing and information science in engineering 19 (4), 2019
52019
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