| Counterfeit integrated circuits: A rising threat in the global semiconductor supply chain U Guin, K Huang, D DiMase, JM Carulli, M Tehranipoor, Y Makris Proceedings of the IEEE 102 (8), 1207-1228, 2014 | 617 | 2014 |
| Counterfeit integrated circuits: Detection, avoidance, and the challenges ahead U Guin, D DiMase, M Tehranipoor Journal of Electronic Testing 30, 9-23, 2014 | 287 | 2014 |
| Systems engineering framework for cyber physical security and resilience D DiMase, ZA Collier, K Heffner, I Linkov Environment Systems and Decisions 35, 291-300, 2015 | 170 | 2015 |
| A blockchain-based framework for supply chain provenance P Cui, J Dixon, U Guin, D Dimase IEEE Access 7, 157113-157125, 2019 | 126 | 2019 |
| Risk-based standards: integrating top–down and bottom–up approaches I Linkov, E Anklam, ZA Collier, D DiMase, O Renn Environment Systems and Decisions 34, 134-137, 2014 | 96 | 2014 |
| A comprehensive framework for counterfeit defect coverage analysis and detection assessment U Guin, D DiMase, M Tehranipoor Journal of Electronic Testing 30, 25-40, 2014 | 96 | 2014 |
| Cybersecurity standards: Managing risk and creating resilience ZA Collier, D DiMase, S Walters, MM Tehranipoor, JH Lambert, I Linkov Computer 47 (9), 70-76, 2014 | 89 | 2014 |
| Traceability and risk analysis strategies for addressing counterfeit electronics in supply chains for complex systems D DiMase, ZA Collier, J Carlson, RB Gray Jr, I Linkov Risk Analysis 36 (10), 1834-1843, 2016 | 74 | 2016 |
| Supply chains ZA Collier, ML Hassler, JH Lambert, D DiMase, I Linkov Cyber Resilience of Systems and Networks, 447-462, 2019 | 17 | 2019 |
| Building a trusted and agile supply chain network for electronic hardware ZA Collier, D Dimase, K Heffner, I Linkov Proceedings from the 20th international command and control research and …, 2015 | 11 | 2015 |
| Rapid three-dimensional reconstruction of printed circuit board using femtosecond laser delayering and digital microscopy H Choi, N May, A Phoulady, Y Suleiman, D DiMase, ... Microelectronics Reliability 138, 114659, 2022 | 5 | 2022 |
| Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation N May, H Choi, A Phoulady, Y Suleiman, D DiMase, P Tavousi, ... Microelectronics Reliability 138, 114660, 2022 | 5 | 2022 |
| A holistic approach to cyber physical systems security and resilience D DiMase, ZA Collier, J Chandy, BS Cohen, G D'Anna, H Dunlap, ... 2020 IEEE Systems Security Symposium (SSS), 1-8, 2020 | 5 | 2020 |
| An industry united to fight counterfeiting. A counterfeit EEE parts solution D DiMase, P Zulueta SMTA international conference, San Diego, CA, 2009 | 3 | 2009 |
| CHASE Survey of Technology Needs SE Quadir, D DiMase, J Chandy University of Connecticut Storrs United States, Tech. Rep, 2017 | 1 | 2017 |
| AVOIDING AND RESOLVING DISPUTES OVER UNSATISFACTORY COMPONENTS K Snider, DJ DiMase | | |
| Counterfeit IC Detection: Test Method Selection Considering Test Time, Cost, and Tier Level Risks U Guin, D Forte, D DiMase, M Tehranipoor | | |
