Παρακολούθηση
Antonio Rubio
Antonio Rubio
Professor of Electrical Engineering (UPC)
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα upc.edu
Τίτλος
Παρατίθεται από
Παρατίθεται από
Έτος
Human powered piezoelectric batteries to supply power to wearable electronic devices
JL González, A Rubio, F Moll
International journal of the Society of Materials Engineering for Resources …, 2002
2242002
Analysis and solutions for switching noise coupling in mixed-signal ICs
X Aragones, JL Gonzalez, A Rubio
Springer Science & Business Media, 2013
1872013
An approach to the analysis and detection of crosstalk faults in digital VLSI circuits
A Rubio, N Itazaki, X Xu, K Kinoshita
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994
1591994
Current vs. logic testing of gate oxide short, floating gate and bridging failures in CMOS
R Rodríguez-Montañés, JA Segura, VH Champac, J Figueras, JA Rubio
1991, Proceedings. International Test Conference, 510, 1991
1291991
Electrical model of the floating gate defect in CMOS ICs: implications on I/sub DDQ/testing
VH Champac, A Rubio, J Figueras
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994
1281994
Dynamic surface temperature measurements in ICs
J Altet, W Claeys, S Dilhaire, A Rubio
Proceedings of the IEEE 94 (8), 1519-1533, 2006
962006
Thermal coupling in integrated circuits: application to thermal testing
J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys
IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001
892001
Crossbar-based memristive logic-in-memory architecture
G Papandroulidakis, I Vourkas, A Abusleme, GC Sirakoulis, A Rubio
IEEE transactions on nanotechnology 16 (3), 491-501, 2017
832017
Experimental comparison of substrate noise coupling using different wafer types
X Aragones, A Rubio
IEEE Journal of Solid-State Circuits 34 (10), 1405-1409, 1999
711999
Quiescent current sensor circuits in digital VLSI CMOS testing
A Rubio, J Figueras, J Segura
Electronics Letters 26 (15), 1204-1206, 1990
691990
A prospect on the use of piezoelectric effect to supply power to wearable electronic devices
JL Gonzalez, A Rubio, F Moll
Fourth Int. Conf. Mater. Eng. Resources, ICMR, 202-206, 2001
662001
A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level
J Segura, C De Benito, A Rubio, CF Hawkins
Proceedings of 1995 IEEE International Test Conference (ITC), 544-551, 1995
661995
Four different approaches for the measurement of IC surface temperature: application to thermal testing
J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ...
Microelectronics journal 33 (9), 689-696, 2002
642002
Reliability challenges in design of memristive memories
P Pouyan, E Amat, A Rubio
2014 5th European Workshop on CMOS Variability (VARI), 1-6, 2014
612014
Fault Modelling of Gate Oxide Short, Floating Gate and Bridging Failuers in CMOS Circuit
VH Champac
Proc. of European Test Conf., 143-148, 1991
581991
Experimental study of artificial neural networks using a digital memristor simulator
V Ntinas, I Vourkas, A Abusleme, GC Sirakoulis, A Rubio
IEEE transactions on neural networks and learning systems 29 (10), 5098-5110, 2018
562018
An approach to crosstalk effect analysis and avoidance techniques in digital CMOS VLSI circuits
R Anglada, A Rubio
International Journal of Electronics 65 (1), 9-17, 1988
551988
Noise generation and coupling mechanisms in deep-submicron ICs
X Aragonès, JL González, F Moll, A Rubio
IEEE Design & Test of Computers 19 (5), 27-35, 2002
542002
Quiescent current analysis and experimentation of defective CMOS circuits
JA Segura, VH Champac, R Rodriguez-Montanes, J Figueras, JA Rubio
Journal of Electronic Testing 3, 337-348, 1992
541992
Thermal testing of integrated circuits
J Altet, A Rubio
Springer Science & Business Media, 2002
522002
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