| Organic transistor model with nonlinear injection: Effects of uneven source contact on apparent mobility and threshold voltage O Simonetti, L Giraudet, T Maurel, JL Nicolas, A Belkhir Organic Electronics 11 (8), 1381-1393, 2010 | 42 | 2010 |
| Characterizations of Ohmic and Schottky-behaving contacts of a single ZnO nanowire B Bercu, W Geng, O Simonetti, S Kostcheev, C Sartel, V Sallet, ... Nanotechnology 24 (41), 415202, 2013 | 37 | 2013 |
| Threshold voltage and turn-on voltage in organic transistors: Sensitivity to contact parasitics L Giraudet, O Simonetti Organic Electronics 12 (1), 219-225, 2011 | 33 | 2011 |
| Characterization of ultrathin metal–oxide–semiconductor structures using coupled current and capacitance–voltage models based on quantum calculation O Simonetti, T Maurel, M Jourdain Journal of applied physics 92 (8), 4449-4458, 2002 | 32 | 2002 |
| Low voltage stress induced leakage currents and surface states in ultrathin (1.2–2.5 nm) oxides A Meinertzhagen, C Petit, D Zander, O Simonetti, T Maurel, M Jourdain Journal of applied physics 91 (4), 2123-2132, 2002 | 31 | 2002 |
| High voltage surface potential measurements in ambient conditions: Application to organic thin-film transistor injection and transport characterization G de Tournadre, F Reisdorffer, R Rödel, O Simonetti, H Klauk, L Giraudet Journal of Applied Physics 119 (12), 2016 | 28 | 2016 |
| Spin-coated conductive polymer film resistivity measurement using the TLM method L Giraudet, S Fauveaux, O Simonetti, C Petit, K Blary, T Maurel, A Belkhir Synthetic metals 156 (11-13), 838-842, 2006 | 28 | 2006 |
| Tailoring the microstructure and charge transport in conjugated polymers by alkyl side-chain engineering S Fall, L Biniek, Y Odarchenko, DV Anokhin, G de Tournadre, P Lévêque, ... Journal of Materials Chemistry C 4 (2), 286-294, 2016 | 26 | 2016 |
| barrier height and its temperature dependence in metal-oxide-semiconductor structures with ultrathin gate oxide A Hadjadj, O Simonetti, T Maurel, G Salace, C Petit Applied physics letters 80 (18), 3334-3336, 2002 | 23 | 2002 |
| Transport models in disordered organic semiconductors and their application to the simulation of thin‐film transistors O Simonetti, L Giraudet Polymer International 68 (4), 620-636, 2019 | 22 | 2019 |
| Parametrization of the Gaussian disorder model to account for the high carrier mobility in disordered organic transistors Y Lee, S Jung, A Plews, A Nejim, O Simonetti, L Giraudet, SD Baranovskii, ... Physical Review Applied 15 (2), 024021, 2021 | 20 | 2021 |
| Extraction of the oxide thickness using a MOS structure quantum model for SiO2 oxide< 5 nm thick films O Simonetti, T Maurel, M Jourdain Journal of non-crystalline solids 280 (1-3), 110-115, 2001 | 20 | 2001 |
| Ohmic contact on single ZnO nanowires grown by MOCVD W Geng, S Kostcheev, C Sartel, V Sallet, M Molinari, O Simonetti, ... physica status solidi (c) 10 (10), 1292-1296, 2013 | 19 | 2013 |
| Effective mobility in amorphous organic transistors: Influence of the width of the density of states O Simonetti, L Giraudet, D Bugnot Organic Electronics 15 (1), 35-39, 2014 | 17 | 2014 |
| New anthracene-based soluble polymers: optical and charge carrier transport properties H Hrichi, K Hriz, N Jaballah, RB Chaâbane, O Simonetti, M Majdoub Journal of Polymer Research 20, 1-16, 2013 | 17 | 2013 |
| Low voltage SILC and P-and N-MOSFET gate oxide reliability C Petit, A Meinertzhagen, D Zander, O Simonetti, M Fadlallah, T Maurel Microelectronics Reliability 45 (3-4), 479-485, 2005 | 15 | 2005 |
| Development of an improved Kelvin probe force microscope for accurate local potential measurements on biased electronic devices NB Bercu, L Giraudet, O Simonetti, M Molinari Journal of Microscopy 267 (3), 272-279, 2017 | 11 | 2017 |
| Sub-threshold current in organic thin film transistors: Influence of the transistor layout O Simonetti, L Giraudet Organic Electronics 14 (3), 909-914, 2013 | 10 | 2013 |
| Stress-induced leakage current at low field in NMOS and PMOS devices with ultra-thin nitrided gate oxide M Fadlallah, G Ghibaudo, M Bidaud, O Simonetti, F Guyader Microelectronic engineering 72 (1-4), 241-246, 2004 | 9 | 2004 |
| Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices M Fadlallah, C Petit, A Meinertzhagen, G Ghibaudo, M Bidaud, ... Microelectronics Reliability 43 (9-11), 1433-1438, 2003 | 4 | 2003 |
