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Co-authors
- Woo Young ChoiAssociate Professor, Department of Electrical and Computer Engineering, Seoul National UniversityVerified email at snu.ac.kr
- Changwook JeongAssociate Professor, Graduate School of Semicondutor Materials and Devices Engineering, UNISTVerified email at unist.ac.kr
- Seonghoon JinSamsung Semiconductor IncVerified email at samsung.com
- Siddhartha DharInstitute for Microelectronics, TU Wien, AustriaVerified email at iue.tuwien.ac.at