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Benedict Drevniok
Benedict Drevniok
Queen's University, Chipworks Inc.
Verified email at queensu.ca
Title
Cited by
Cited by
Year
Ultra stable self-assembled monolayers of N-heterocyclic carbenes on gold
CM Crudden, JH Horton, II Ebralidze, OV Zenkina, AB McLean, ...
Nature chemistry 6 (5), 409-414, 2014
4612014
Simple direct formation of self-assembled N-heterocyclic carbene monolayers on gold and their application in biosensing
CM Crudden, JH Horton, MR Narouz, Z Li, CA Smith, K Munro, ...
Nature Communications 7 (1), 12654, 2016
2082016
Methods and instrumentation for piezoelectric motors
B Drevniok, WMP Paul, KR Hairsine, AB McLean
Review of Scientific Instruments 83 (3), 2012
262012
Dynamic strain measurements in a sliding microstructured contact
R Bennewitz, J David, CF de Lannoy, B Drevniok, P Hubbard-Davis, ...
Journal of Physics: Condensed Matter 20 (1), 015004, 2007
222007
Practical quantitative scanning microwave impedance microscopy
O Amster, F Stanke, S Friedman, Y Yang, DW St J, B Drevniok
Microelectronics Reliability 76, 214-217, 2017
202017
Extending electrical scanning probe microscopy measurements of semiconductor devices using microwave impedance microscopy
B Drevniok, SJ Dixon-Warren, O Amster, SL Friedman, Y Yang
ISTFA 2015, 82-86, 2015
152015
Room Temperature Discrimination of Adsorbed Molecules and Attachment Sites on the Si (111)–7× 7 Surface Using a qPlus Sensor
Z Majzik, B Drevniok, W Kaminski, M Ondracek, AB McLean, P Jelinek
ACS nano 7 (3), 2686-2692, 2013
142013
Practical quantitative scanning microwave impedance microscopy of semiconductor devices
O Amster, Y Yang, B Drevniok, S Friedman, F Stanke, DW St J
2017 IEEE 24th International Symposium on the Physical and Failure Analysis …, 2017
72017
Surface and near surface defects in δ-doped Si (1 1 1)
DP Andrade, RH Miwa, B Drevniok, P Drage, AB McLean
Journal of Physics: Condensed Matter 27 (12), 125001, 2015
62015
A vertical coarse approach scanning tunneling microscope
B Drevniok
Masters Thesis, 8, 2009
32009
Practical Quantitative Scanning Microwave Impedance Microscopy
SJ Dixon-Warren, B Drevniok
EDFA Technical Articles 19 (3), 22-27, 2017
2017
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Articles 1–11