Microwave filters with improved stopband based on sub-wavelength resonators J Garcia-Garcia, F Martín, F Falcone, J Bonache, JD Baena, I Gil, E Amat, ...
IEEE Transactions on Microwave theory and techniques 53 (6), 1997-2006, 2005
257 2005 Reliability challenges in design of memristive memories P Pouyan, E Amat, A Rubio
2014 5th European Workshop on CMOS Variability (VARI), 1-6, 2014
61 2014 Channel Hot-Carrier Degradation in Short-Channel Transistors With High- /Metal Gate Stacks E Amat, T Kauerauf, R Degraeve, A De Keersgieter, R Rodriguez, ...
IEEE Transactions on Device and Materials reliability 9 (3), 425-430, 2009
56 2009 Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures E Amat, T Kauerauf, R Degraeve, R Rodriguez, M Nafria, X Aymerich, ...
IEEE Transactions on Device and Materials Reliability 9 (3), 454-458, 2009
52 2009 Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack E Amat, T Kauerauf, R Degraeve, R Rodríguez, M Nafría, X Aymerich, ...
Microelectronic Engineering 87 (1), 47-50, 2010
46 2010 UTBB FDSOI technology flexibility for ultra low power internet-of-things applications E Beigné, JF Christmann, A Valentian, O Billoint, E Amat, D Morche
2015 45th European Solid State Device Research Conference (ESSDERC), 164-167, 2015
36 2015 Memristive crossbar memory lifetime evaluation and reconfiguration strategies E Amat, A Rubio
IEEE Transactions on Emerging Topics in Computing 6 (2), 207-218, 2016
33 2016 Channel-hot-carrier degradation and bias temperature instabilities in CMOS inverters J Martin-Martinez, S Gerardin, E Amat, R Rodriguez, M Nafria, X Aymerich, ...
IEEE transactions on electron devices 56 (9), 2155-2159, 2009
30 2009 Exploring the influence of variability on single-electron transistors into SET-based circuits E Amat, J Bausells, F Perez-Murano
IEEE Transactions on Electron Devices 64 (12), 5172-5180, 2017
26 2017 A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics E Amat, T Kauerauf, R Rodríguez, M Nafría, X Aymerich, R Degraeve, ...
Microelectronic engineering 103, 144-149, 2013
26 2013 Process variability-aware proactive reconfiguration technique for mitigating aging effects in nano scale SRAM lifetime P Pouyan, E Amat, A Rubio
2012 IEEE 30th VLSI Test Symposium (VTS), 240-245, 2012
25 2012 Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs D Maji, F Crupi, E Amat, E Simoen, B De Jaeger, DP Brunco, CR Manoj, ...
IEEE transactions on electron devices 56 (5), 1063-1069, 2009
25 2009 RRAM variability and its mitigation schemes P Pouyan, E Amat, S Hamdioui, A Rubio
2016 26th international workshop on power and timing modeling, optimization …, 2016
24 2016 Gate Voltage Influence on the Channel Hot-Carrier Degradation of High- -Based Devices E Amat, T Kauerauf, R Degraeve, R Rodríguez, M Nafría, X Aymerich, ...
IEEE Transactions on Device and Materials Reliability 11 (1), 92-97, 2010
21 2010 Statistical lifetime analysis of memristive crossbar matrix P Pouyan, E Amat, A Rubio
2015 10th International Conference on Design & Technology of Integrated …, 2015
20 2015 Influence of the SiO2 layer thickness on the degradation of HfO2/SiO2 stacks subjected to static and dynamic stress conditions E Amat, R Rodríguez, M Nafría, X Aymerich, JH Stathis
Microelectronics Reliability 47 (4-5), 544-547, 2007
20 2007 Feasibility of embedded DRAM cells on FinFET technology E Amat, A Calomarde, F Moll, R Canal, A Rubio
IEEE Transactions on Computers 65 (4), 1068-1074, 2014
15 2014 SET and noise fault tolerant circuit design techniques: Application to 7 nm FinFET A Calomarde, E Amat, F Moll, J Vigara, A Rubio
Microelectronics Reliability 54 (4), 738-745, 2014
15 2014 Influence of quantum dot characteristics on the performance of hybrid SET-FET circuits E Amat, F Klüpfel, J Bausells, F Perez-Murano
IEEE Transactions on Electron Devices 66 (10), 4461-4467, 2019
13 2019 Systematic and random variability analysis of two different 6T-SRAM layout topologies E Amat, E Amatllé, S Gómez, N Aymerich, CG Almudéver, F Moll, A Rubio
Microelectronics Journal 44 (9), 787-793, 2013
13 2013