Alfredo Benso
Alfredo Benso
Politecnico di Torino - Systems Biology Group
Verified email at polito.it
Title
Cited by
Cited by
Year
An expanded evaluation of protein function prediction methods shows an improvement in accuracy
Y Jiang, TR Oron, WT Clark, AR Bankapur, D D’Andrea, R Lepore, ...
Genome biology 17 (1), 1-19, 2016
2842016
Fault injection techniques and tools for embedded systems reliability evaluation
A Benso, P Prinetto
Springer Science & Business Media, 2003
2732003
AC/C++ source-to-source compiler for dependable applications
A Benso, S Chiusano, P Prinetto, L Tagliaferri
Proceeding International Conference on Dependable Systems and Networks. DSN …, 2000
1072000
The CAFA challenge reports improved protein function prediction and new functional annotations for hundreds of genes through experimental screens
N Zhou, Y Jiang, TR Bergquist, AJ Lee, BZ Kacsoh, AW Crocker, ...
Genome biology 20 (1), 1-23, 2019
1052019
A watchdog processor to detect data and control flow errors
A Benso, S Di Carlo, G Di Natale, P Prinetto
9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 144-148, 2003
782003
Fault-list collapsing for fault-injection experiments
A Benso, M Rebaudengo, L Impagliazzo, P Marmo
Annual Reliability and Maintainability Symposium. 1998 Proceedings …, 1998
781998
An on-line BIST RAM architecture with self-repair capabilities
A Benso, S Chiusano, G Di Natale, P Prinetto
IEEE Transactions on Reliability 51 (1), 123-128, 2002
662002
Control-flow checking via regular expressions
A Benso, S Di Carlo, G Di Natale, P Prinetto, L Tagliaferri
Proceedings 10th Asian Test Symposium, 299-303, 2001
572001
HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
A Benso, S Chiusano, S Di Carlo, P Prinetto, F Ricciato, M Spadari, ...
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
542000
A programmable BIST architecture for clusters of multiple-port SRAMs
A Benso, S Di Carlo, G Di Natale, P Prinetto, ML Bodoni
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
492000
March AB, March AB1: new March tests for unlinked dynamic memory faults
A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto
IEEE International Conference on Test, 2005., 8 pp.-841, 2005
472005
Fault behavior observation of a microprocessor system through a VHDL simulation-based fault injection experiment
AM Amendola, A Benso, F Corno, L Impagliazzo, P Marmo, P Prinetto, ...
Proceedings EURO-DAC'96. European Design Automation Conference with EURO …, 1996
471996
IEEE standard 1500 compliance verification for embedded cores
A Benso, S Di Carlo, P Prinetto, Y Zorian
IEEE transactions on very large scale integration (VLSI) systems 16 (4), 397-407, 2008
422008
Statistical reliability estimation of microprocessor-based systems
A Savino, S Di Carlo, G Politano, A Benso, A Bosio, G Di Natale
IEEE Transactions on Computers 61 (11), 1521-1534, 2011
412011
EXFI: a low-cost fault injection system for embedded microprocessor-based boards
A Benso, P Prinetto, M Rebaudengo, MS Reorda
ACM Transactions on Design Automation of Electronic Systems (TODAES) 3 (4 …, 1998
391998
An effective distributed BIST architecture for RAMs
ML Bodoni, A Benso, S Chiusano, S Di Carlo, G Di Natale, P Prinetto
Proceedings IEEE European Test Workshop, 119-124, 2000
382000
Data criticality estimation in software applications
A Benso, S Di Carlo, G Di Natale, P Prinetto, L Tagliaferri
International test conference, 802-810, 2003
372003
Specification and design of a new memory fault simulator
A Benso, S Di Carlo, G Di Natale, P Prinetto
Proceedings of the 11th Asian Test Symposium, 2002.(ATS'02)., 92-97, 2002
372002
A functional verification based fault injection environment
A Benso, A Bosio, S Di Carlo, R Mariani
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
362007
Estimation of sickness absenteeism among Italian healthcare workers during seasonal influenza epidemics
MM Gianino, G Politano, A Scarmozzino, L Charrier, M Testa, ...
PloS one 12 (8), e0182510, 2017
342017
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