Jia (Peter) Liu
Cited by
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Online real-time quality monitoring in additive manufacturing processes using heterogeneous sensors
PK Rao, JP Liu, D Roberson, ZJ Kong, C Williams
Journal of Manufacturing Science and Engineering 137 (6), 2015
Dirichlet process Gaussian mixture models for real-time monitoring and their application to chemical mechanical planarization
JP Liu, OF Beyca, PK Rao, ZJ Kong, STS Bukkapatnam
IEEE Transactions on Automation Science and Engineering 14 (1), 208-221, 2016
Sensor-based online process fault detection in additive manufacturing
PK Rao, JP Liu, D Roberson, ZJ Kong
ASME 2015 International Manufacturing Science and Engineering Conference, 2015
Layer-wise Spatial Modeling of Porosity in Additive Manufacturing
JP Liu, C Liu, Y Bai, PK Rao, C Williams, ZJ Kong
IISE Transactions, 2018
Deep convolutional neural network-based epileptic electroencephalogram (EEG) signal classification
Y Gao, B Gao, Q Chen, J Liu, Y Zhang
Frontiers in neurology 11, 2020
Wafer quality monitoring using spatial Dirichlet process based mixed-effect profile modeling scheme
JP Liu, R Jin, ZJ Kong
Journal of Manufacturing Systems 48, 21-32, 2018
Multivariate statistical process monitoring scheme with PLS and SVDD
J Liu, Y Sun
Proceedings of 20th International Conference on Industrial Engineering and …, 2013
Machine learning–driven in situ process monitoring with vibration frequency spectra for chemical mechanical planarization
JP Liu, J Zheng, P Rao, ZJ Kong
The International Journal of Advanced Manufacturing Technology 111 (7), 1873 …, 2020
PCA-based weighted similarity calculation algorithm for steel materials matching
J Liu, Y Sun, H Xu, Z Yu
Proceedings of the 32nd Chinese Control Conference, 3917-3922, 2013
A General Steel Hardenability Calculation Method
ZG Yu, LN Wang, J Liu
Advanced Materials Research 816, 140-143, 2013
Accepted by IISE Transactions (Special Issue on Additive Manufacturing) on 5/10/2018
JP Liu, C Liu, Y Bai, P Rao, C Williams, ZJ Kong
Dirichlet Process Gaussian Mixture (DPGM) Models for Real-Time Monitoring and its Application to Chemical Mechanical Planarization (CMP)
JP Liu, OF Beyca, PK Rao, ZJ Kong, STS Bukkapatnam
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