| Helium ion microscopy for high‐resolution visualization of the articular cartilage collagen network WS Vanden Berg‐Foels, L Scipioni, C Huynh, X Wen Journal of microscopy 246 (2), 168-176, 2012 | 88 | 2012 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland US Patent 7,241,361, 2007 | 69 | 2007 |
| Easy growth of undoped and doped tungsten oxide nanowires with high purity and orientation K Liu, DT Foord, L Scipioni Nanotechnology 16 (1), 10, 2004 | 61 | 2004 |
| Performance of multicusp plasma ion source for focused ion beam applications L Scipioni, D Stewart, D Ferranti, A Saxonis Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000 | 47 | 2000 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland US Patent 7,670,455, 2010 | 41 | 2010 |
| Dual beam system R Hill, CA Sanford, L Scipioni, M DiManna, M Tanguay US Patent 7,161,159, 2007 | 41 | 2007 |
| Multibeam System M Utlaut, N Smith, PP Tesch, T Miller, DH Narum, D Tuggle, L Scipioni US Patent App. 12/812,221, 2011 | 40 | 2011 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland US Patent 8,168,957, 2012 | 36 | 2012 |
| Fabrication of three dimensional structures L Scipioni US Patent 7,160,475, 2007 | 36 | 2007 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland US Patent 8,829,468, 2014 | 21 | 2014 |
| Sample decontamination LA Stern, LS Farkas III, BW Ward, W DiNatale, JA Notte IV, L Scipioni US Patent 8,013,300, 2011 | 20 | 2011 |
| Method of fabricating nanodevices G Schwind, G Magera, L Scipioni US Patent 7,544,523, 2009 | 20 | 2009 |
| System for imaging a cross-section of a substrate S Berger, L Scipioni US Patent 6,838,668, 2005 | 20 | 2005 |
| System for imaging a cross-section of a substrate S Berger, L Scipioni US Patent 6,727,500, 2004 | 19 | 2004 |
| In-situ and ex-situ comparison of the electrochemical oxidation of SO2 on carbon supported Pt and Au catalysts BH Meekins, AB Thompson, V Gopal, BAT Mehrabadi, MC Elvington, ... International Journal of Hydrogen Energy 45 (3), 1940-1947, 2020 | 15 | 2020 |
| Dual beam system R Hill, CA Sanford, L Scipioni, M DiManna, M Tanguay US Patent 7,601,976, 2009 | 13 | 2009 |
| Determining end points during charged particle beam processing V Ray, L Scipioni, N Bassom US Patent App. 10/777,672, 2005 | 10 | 2005 |
| Plasma source for a focused ion beam system J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland US Patent 9,640,367, 2017 | 9 | 2017 |
| Reducing particle implantation R Knippelmeyer, N Economou, M Ananth, LA Stern, B DiNatale, ... US Patent 8,907,277, 2014 | 9 | 2014 |
| Dual beam system R Hill, L Scipioni, CA Sanford, M DiManna, M Tanguay US Patent 8,013,311, 2011 | 9 | 2011 |
