Material Properties and Structural Characterization of M3Si6O12N2: Eu2+ (M= Ba, Sr)—A Comprehensive Study on a Promising Green Phosphor for pc‐LEDs C Braun, M Seibald, SL Boerger, O Oeckler, TD Boyko, A Moewes, ... Chemistry-A European Journal 16 (31), 9646-9657, 2010 | 132 | 2010 |
Epoxide Speciation and Functional Group Distribution in Graphene Oxide Paper‐Like Materials A Hunt, DA Dikin, EZ Kurmaev, TD Boyko, P Bazylewski, GS Chang, ... Advanced Functional Materials 22 (18), 3950-3957, 2012 | 87 | 2012 |
Electronic Structure of Spinel-Type Nitride Compounds , , and with Tunable Band Gaps: Application to Light Emitting Diodes TD Boyko, A Hunt, A Zerr, A Moewes Physical review letters 111 (9), 097402, 2013 | 76 | 2013 |
Investigations of the Electronic Structure and Bandgap of the Next‐Generation LED‐Phosphor Sr [LiAl3N4]: Eu2+—Experiment and Calculations TM Tolhurst, TD Boyko, P Pust, NW Johnson, W Schnick, A Moewes Advanced Optical Materials 3 (4), 546-550, 2015 | 74 | 2015 |
Structural and band Gap investigation of GaN: ZnO heterojunction solid solution photocatalyst probed by soft X-ray spectroscopy EJ McDermott, EZ Kurmaev, TD Boyko, LD Finkelstein, RJ Green, ... The Journal of Physical Chemistry C 116 (14), 7694-7700, 2012 | 59 | 2012 |
Effect of 3d doping on the electronic structure of BaFe2As2 JA McLeod, A Buling, RJ Green, TD Boyko, NA Skorikov, EZ Kurmaev, ... Journal of Physics: Condensed Matter 24 (21), 215501, 2012 | 43 | 2012 |
Class of tunable wide band gap semiconductors γ−(Ge x Si 1− x) 3 N 4 TD Boyko, E Bailey, A Moewes, PF McMillan Physical Review B 81 (15), 155207, 2010 | 40 | 2010 |
Electronic band gap reduction in manganese carbodiimide: MnNCN TD Boyko, RJ Green, R Dronskowski, A Moewes The Journal of Physical Chemistry C 117 (24), 12754-12761, 2013 | 39 | 2013 |
Ca3N2 and Mg3N2: Unpredicted High-Pressure Behavior of Binary Nitrides C Braun, SL Börger, TD Boyko, G Miehe, H Ehrenberg, P Höhn, ... Journal of the American Chemical Society 133 (12), 4307-4315, 2011 | 35 | 2011 |
Orbital order and fluctuations in the two-leg ladder materials ( and Se) and K Takubo, Y Yokoyama, H Wadati, S Iwasaki, T Mizokawa, T Boyko, ... Physical Review B 96 (11), 115157, 2017 | 33 | 2017 |
Orbital order and fluctuation in BaFe ( = S and Se) and CsFeSe probed by x-ray absorption and resonant inelastic x-ray scattering spectroscopy K Takubo, Y Yokoyama, H Wadati, T Mizokawa, T Boyko, R Sutarto, F He, ... arXiv preprint arXiv:1704.04864, 2017 | 33* | 2017 |
Experiment‐Driven Modeling of Crystalline Phosphorus Nitride P3N5: Wide‐Ranging Implications from a Unique Structure TM Tolhurst, C Braun, TD Boyko, W Schnick, A Moewes Chemistry-A European Journal 22 (30), 10475-10483, 2016 | 30 | 2016 |
Band gap and electronic structure of MgSiN2 determined using soft X‐ray spectroscopy and density functional theory T Boer, TD Boyko, C Braun, W Schnick, A Moewes physica status solidi (RRL)-Rapid Research Letters 9 (4), 250-254, 2015 | 25 | 2015 |
Anion ordering in spinel-type gallium oxonitride TD Boyko, CE Zvoriste, I Kinski, R Riedel, S Hering, H Huppertz, ... Physical Review B 84 (8), 085203, 2011 | 16 | 2011 |
The local crystal structure and electronic band gap of β-sialons TD Boyko, T Gross, M Schwarz, H Fuess, A Moewes Journal of materials science 49 (8), 3242-3252, 2014 | 14 | 2014 |
Selective response of mesoporous silicon to adsorbants with nitro groups JA McLeod, EZ Kurmaev, PV Sushko, TD Boyko, IA Levitsky, A Moewes Chemistry-A European Journal 18 (10), 2912-2922, 2012 | 10 | 2012 |
The hardness of group 14 spinel nitrides revisited TD Boyko, A Moewes Journal of the Ceramic Society of Japan 124 (10), 1063-1066, 2016 | 7 | 2016 |
Measuring partial fluorescence yield using filtered detectors TD Boyko, RJ Green, A Moewes, TZ Regier Journal of synchrotron radiation 21 (4), 716-721, 2014 | 2 | 2014 |
Methods of selectively detecting the presence of a compound in a gaseous medium A Moewes, JA McLeod, EZ Kurmaev, IA Levitsky, P Sushko, TD Boyko US Patent App. 13/752,866, 2013 | 2 | 2013 |
Electronic structure of hydrogenated amorphous Si1–xNx thin films using soft X‐ray emission and absorption measurements T Boyko, S Kasap, R Johanson, S Kobayashi, T Aoki, A Moewes physica status solidi (a) 206 (5), 935-939, 2009 | 2 | 2009 |