On the origin and structure of the first sharp diffraction peak of amorphous silicon D Dahal, H Warren, P Biswas physica status solidi (b) 258 (9), 2000447, 2021 | 9 | 2021 |
Hyperuniformity and static structure factor of amorphous silicon in the infinite-wavelength limit D Dahal, R Atta-Fynn, SR Elliott, P Biswas Journal of Physics: Conference Series 1252 (1), 012003, 2019 | 6 | 2019 |
Extended-range order in tetrahedral amorphous semiconductors: The case of amorphous silicon D Dahal, SR Elliott, P Biswas Physical Review B 105 (11), 115203, 2022 | 4 | 2022 |
Insights into the origin of the first sharp diffraction peak in amorphous silica from an analysis of chemical and radial ordering P Biswas, D Dahal, SR Elliott Physical Review B 109 (10), 104207, 2024 | | 2024 |
Ab initio studies of the impact of the Debye-Waller factor on the structural and dynamical properties of amorphous semiconductors: The case of -Si D Dahal, R Atta-Fynn, SR Elliott, P Biswas Physical Review B 108 (9), 094206, 2023 | | 2023 |