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Houman Zahedmanesh
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Determination of the influence of stent strut thickness using the finite element method: implications for vascular injury and in-stent restenosis
H Zahedmanesh, C Lally
Medical & biological engineering & computing 47, 385-393, 2009
1742009
Simulation of a balloon expandable stent in a realistic coronary artery—Determination of the optimum modelling strategy
H Zahedmanesh, DJ Kelly, C Lally
Journal of Biomechanics 43 (11), 2126-2132, 2010
1712010
Bacterial cellulose as a potential vascular graft: mechanical characterization and constitutive model development
H Zahedmanesh, JN Mackle, A Sellborn, K Drotz, A Bodin, P Gatenholm, ...
Journal of Biomedical Materials Research Part B: Applied Biomaterials 97 (1 …, 2011
952011
A multiscale mechanobiological modelling framework using agent-based models and finite element analysis: application to vascular tissue engineering
H Zahedmanesh, C Lally
Biomechanics and modeling in mechanobiology 11, 363-377, 2012
792012
A multi-scale mechanobiological model of in-stent restenosis: deciphering the role of matrix metalloproteinase and extracellular matrix changes
H Zahedmanesh, H Van Oosterwyck, C Lally
Computer methods in biomechanics and biomedical engineering 17 (8), 813-828, 2014
652014
Interconnect metals beyond copper: Reliability challenges and opportunities
K Croes, C Adelmann, CJ Wilson, H Zahedmanesh, OV Pedreira, C Wu, ...
2018 IEEE International Electron Devices Meeting (IEDM), 5.3. 1-5.3. 4, 2018
642018
A method to develop mock arteries suitable for cell seeding and in-vitro cell culture experiments
A Colombo, H Zahedmanesh, DM Toner, PA Cahill, C Lally
Journal of the mechanical behavior of biomedical materials 3 (6), 470-477, 2010
392010
Buried power rail integration with FinFETs for ultimate CMOS scaling
A Gupta, OV Pedreira, G Arutchelvan, H Zahedmanesh, K Devriendt, ...
IEEE Transactions on Electron Devices 67 (12), 5349-5354, 2020
322020
Airgaps in nano-interconnects: Mechanics and impact on electromigration
H Zahedmanesh, PR Besser, CJ Wilson, K Croes
Journal of Applied Physics 120 (9), 2016
302016
Copper electromigration; prediction of scaling limits
H Zahedmanesh, OV Pedreira, C Wilson, Z Tőkei, K Croes
Proceedings of IEEE International Interconnect Technology Conference (IITC), 3-5, 2019
272019
EUV lithography imaging using novel pellicle membranes
I Pollentier, J Vanpaemel, JU Lee, C Adelmann, H Zahedmanesh, ...
Extreme Ultraviolet (EUV) Lithography VII 9776, 587-600, 2016
252016
Multiscale computer modeling in biomechanics and biomedical engineering
A Gefen
Springer Science & Business Media, 2014
252014
Investigating the electromigration limits of Cu nano-interconnects using a novel hybrid physics-based model
H Zahedmanesh, O Varela Pedreira, Z Tőkei, K Croes
Journal of Applied Physics 126 (5), 2019
242019
Novel membrane solutions for the EUV pellicle: better or not?
I Pollentier, JU Lee, M Timmermans, C Adelmann, H Zahedmanesh, ...
Extreme Ultraviolet (EUV) Lithography VIII 10143, 125-134, 2017
232017
Properties and performance of EUVL pellicle membranes
EE Gallagher, J Vanpaemel, I Pollentier, H Zahedmanesh, C Adelmann, ...
Photomask Technology 2015 9635, 206-213, 2015
232015
Electromigration and thermal storage study of barrierless Co vias
OV Pedreira, K Croes, H Zahedmanesh, K Vandersmissen, ...
2018 IEEE International Interconnect Technology Conference (IITC), 48-50, 2018
212018
Deciphering mechanical regulation of chondrogenesis in fibrin–polyurethane composite scaffolds enriched with human mesenchymal stem cells: a dual computational and experimental …
H Zahedmanesh, M Stoddart, P Lezuo, C Forkmann, MA Wimmmer, ...
Tissue Engineering Part A 20 (7-8), 1197-1212, 2014
212014
Inflection points in interconnect research and trends for 2nm and beyond in order to solve the RC bottleneck
Z Tőkei, V Vega, G Murdoch, M O’Toole, K Croes, R Baert, ...
2020 IEEE International Electron Devices Meeting (IEDM), 32.2. 1-32.2. 4, 2020
192020
Introducing the EUV CNT pellicle
JU Lee, J Vanpaemel, I Pollentier, C Adelmann, H Zahedmanesh, ...
Photomask Technology 2016 9985, 26-33, 2016
182016
A numerical study on nano-indentation induced fracture of low dielectric constant brittle thin films using cube corner probes
H Zahedmanesh, K Vanstreels, M Gonzalez
Microelectronic Engineering 156, 108-115, 2016
182016
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Articles 1–20