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Henning Döscher
Henning Döscher
Fraunhofer Institute for Systems and Innovation Research ISI
Verified email at isi.fraunhofer.de
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Cited by
Year
Direct solar-to-hydrogen conversion via inverted metamorphic multi-junction semiconductor architectures
JL Young, MA Steiner, H Döscher, RM France, JA Turner, TG Deutsch
Nature Energy 2 (4), 1-8, 2017
4142017
Enhancement of the zero phonon line emission from a single nitrogen vacancy center in a nanodiamond via coupling to a photonic crystal cavity
J Wolters, AW Schell, G Kewes, N Nüsse, M Schoengen, H Döscher, ...
Applied Physics Letters 97 (14), 2010
3002010
Sunlight absorption in water–efficiency and design implications for photoelectrochemical devices
H Döscher, JF Geisz, TG Deutsch, JA Turner
Energy & Environmental Science 7 (9), 2951-2956, 2014
2162014
Solar-to-hydrogen efficiency: shining light on photoelectrochemical device performance
H Döscher, JL Young, JF Geisz, JA Turner, TG Deutsch
Energy & Environmental Science 9 (1), 74-80, 2016
1362016
Emerging Postsynthetic Improvements of BiVO4 Photoanodes for Solar Water Splitting
B Lamm, BJ Trzesniewski, H Doscher, WA Smith, M Stefik
ACS Energy Letters 3 (1), 112-124, 2017
1112017
In situ reflection anisotropy spectroscopy analysis of heteroepitaxial GaP films grown on Si (100)
H Döscher, T Hannappel
Journal of Applied Physics 107 (12), 2010
862010
In situ verification of single-domain III-V on Si (100) growth via metal-organic vapor phase epitaxy
H Döscher, T Hannappel, B Kunert, A Beyer, K Volz, W Stolz
Applied Physics Letters 93 (17), 2008
852008
Anomalous double-layer step formation on Si (100) in hydrogen process ambient
S Brückner, H Döscher, P Kleinschmidt, O Supplie, A Dobrich, ...
Physical Review B 86 (19), 195310, 2012
632012
Epitaxial III–V films and surfaces for photoelectrocatalysis
H Döscher, O Supplie, MM May, P Sippel, C Heine, AG Muñoz, ...
ChemPhysChem 13 (12), 2899-2909, 2012
622012
Atomic scale analysis of the GaP/Si (100) heterointerface by in situ reflection anisotropy spectroscopy and ab initio density functional theory
O Supplie, S Brückner, O Romanyuk, H Döscher, C Höhn, MM May, ...
Physical Review B 90 (23), 235301, 2014
482014
Surface preparation of Si (1 0 0) by thermal oxide removal in a chemical vapor environment
H Döscher, S Brückner, A Dobrich, C Höhn, P Kleinschmidt, T Hannappel
Journal of Crystal Growth 315 (1), 10-15, 2011
482011
In situ investigation of hydrogen interacting with Si (100)
S Brückner, H Döscher, P Kleinschmidt, T Hannappel
Applied Physics Letters 98 (21), 2011
462011
Indirect in situ characterization of Si (1 0 0) substrates at the initial stage of III–V heteroepitaxy
H Döscher, O Supplie, S Brückner, T Hannappel, A Beyer, J Ohlmann, ...
Journal of Crystal Growth 315 (1), 16-21, 2011
422011
Energiespeicher-Roadmap (Update 2017)-Hochenergie-Batterien 2030+ und Perspektiven zukünftiger Batterietechnologien
A Thielmann, C Neef, T Hettesheimer, H Döscher, M Wietschel, J Tübke
Fraunhofer-Institut für System-und Innovationsforschung ISI, 2017
402017
Domain-sensitive in situ observation of layer-by-layer removal at Si (100) in H2 ambient
S Brückner, P Kleinschmidt, O Supplie, H Döscher, T Hannappel
New Journal of Physics 15 (11), 113049, 2013
392013
III–V on silicon: Observation of gallium phosphide anti-phase disorder by low-energy electron microscopy
H Döscher, B Borkenhagen, G Lilienkamp, W Daum, T Hannappel
Surface science 605 (15-16), L38-L41, 2011
392011
In situ antiphase domain quantification applied on heteroepitaxial GaP growth on Si (100)
H Döscher, B Kunert, A Beyer, O Supplie, K Volz, W Stolz, T Hannappel
Journal of Vacuum Science & Technology B 28 (4), C5H1-C5H6, 2010
362010
Graphene Roadmap Briefs (No. 2): industrialization status and prospects 2020
H Döscher, T Schmaltz, C Neef, A Thielmann, T Reiss
2D Materials 8 (2), 022005, 2021
332021
Si (100) surfaces in a hydrogen-based process ambient
H Döscher, A Dobrich, S Brückner, P Kleinschmidt, T Hannappel
Applied Physics Letters 97 (15), 2010
312010
Atomic surface structure of Si (1 0 0) substrates prepared in a chemical vapor environment
H Döscher, P Kleinschmidt, T Hannappel
Applied surface science 257 (2), 574-580, 2010
292010
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