| Cost-effective TSV grouping for yield improvement of 3D-ICs Y Zhao, S Khursheed, BM Al-Hashimi 2011 Asian Test Symposium, 201-206, 2011 | 77 | 2011 |
| Bridging fault test method with adaptive power management awareness S Khursheed, U Ingelsson, P Rosinger, BM Al-Hashimi, P Harrod IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 49 | 2008 |
| Online fault tolerance technique for TSV-based 3-D-IC Y Zhao, S Khursheed, BM Al-Hashimi IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (8 …, 2014 | 43 | 2014 |
| Aging benefits in nanometer CMOS designs D Rossi, V Tenentes, S Yang, S Khursheed, BM Al-Hashimi IEEE Transactions on Circuits and Systems II: Express Briefs 64 (3), 324-328, 2016 | 40 | 2016 |
| Process variation-aware test for resistive bridges U Ingelsson, BM Al-Hashimi, S Khursheed, SM Reddy, P Harrod IEEE transactions on computer-aided design of integrated circuits and …, 2009 | 36 | 2009 |
| Improved dft for testing power switches S Khursheed, S Yang, BM Al-Hashimi, X Huang, D Flynn 2011 Sixteenth IEEE European Test Symposium, 7-12, 2011 | 33 | 2011 |
| Reliable power gating with NBTI aging benefits D Rossi, V Tenentes, S Yang, S Khursheed, BM Al-Hashimi IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (8 …, 2016 | 31 | 2016 |
| Diagnosis of multiple-voltage design with bridge defect S Khursheed, BM Al-Hashimi, SM Reddy, P Harrod IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009 | 26 | 2009 |
| Hardware trojan detection on a pcb through differential power monitoring G Piliposyan, S Khursheed, D Rossi IEEE Transactions on Emerging Topics in Computing 10 (2), 740-751, 2020 | 21 | 2020 |
| A cost-effective fault tolerance technique for functional TSV in 3-D ICs RP Reddy, A Acharyya, S Khursheed IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (7 …, 2017 | 21 | 2017 |
| NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi 2015 20th IEEE European Test Symposium (ETS), 1-6, 2015 | 20 | 2015 |
| Coarse-grained online monitoring of bti aging by reusing power-gating infrastructure V Tenentes, D Rossi, S Yang, S Khursheed, BM Al-Hashimi, SR Gunn IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (4 …, 2016 | 19 | 2016 |
| BTI and leakage aware dynamic voltage scaling for reliable low power cache memories D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi 2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 194-199, 2015 | 19 | 2015 |
| Impact of PVT variation on delay test of resistive open and resistive bridge defects S Zhong, S Khursheed, BM Al-Hashimi 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2013 | 17 | 2013 |
| Delay test for diagnosis of power switches S Khursheed, K Shi, BM Al-Hashimi, PR Wilson, K Chakrabarty IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (2), 197-206, 2013 | 15 | 2013 |
| A fast and accurate process variation-aware modeling technique for resistive bridge defects S Zhong, S Khursheed, BM Al-Hashimi IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011 | 14 | 2011 |
| Modeling the impact of process variation on resistive bridge defects S Khursheed, S Zhong, R Aitken, BM Al-Hashimi, S Kundu 2010 IEEE International Test Conference, 1-10, 2010 | 14 | 2010 |
| Resistive bridging faults DFT with adaptive power management awareness U Ingelsson, P Rosinger, SS Khursheed, BM Al-Hashimi, P Harrod 16th Asian Test Symposium (ATS 2007), 101-106, 2007 | 14 | 2007 |
| Improved state integrity of flip-flops for voltage scaled retention under PVT variation S Yang, S Khursheed, BM Al-Hashimi, D Flynn, GV Merrett IEEE Transactions on Circuits and Systems I: Regular Papers 60 (11), 2953-2961, 2013 | 12 | 2013 |
| Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation AH El-Maleh, SS Khursheed, SM Sait IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006 | 12 | 2006 |
Bashir M. Al-HashimiProfessor of Computer Engineering, King’s College LondonVerified email at kcl.ac.uk
