matthew phillips
matthew phillips
Professor of Applied Physics, University of Technology, Sydney
Verified email at uts.edu.au
TitleCited byYear
Cathodoluminescence microcharacterization of the defect structure of quartz
MAS Kalceff, MR Phillips
Physical Review B 52 (5), 3122, 1995
3111995
Characteristics of point defects in the green luminescence from Zn-and O-rich ZnO
C Ton-That, L Weston, MR Phillips
Physical Review B 86 (11), 115205, 2012
1502012
Bound excitons in ZnO: Structural defect complexes versus shallow impurity centers
MR Wagner, G Callsen, JS Reparaz, JH Schulze, R Kirste, M Cobet, ...
Physical Review B 84 (3), 035313, 2011
1482011
Nanoindentation of epitaxial GaN films
SO Kucheyev, JE Bradby, JS Williams, C Jagadish, M Toth, MR Phillips, ...
Applied Physics Letters 77 (21), 3373-3375, 2000
1202000
Chemical origin of the yellow luminescence in GaN
SO Kucheyev, M Toth, MR Phillips, JS Williams, C Jagadish, G Li
Journal of applied physics 91 (9), 5867-5874, 2002
1162002
Indentation-induced damage in GaN epilayers
JE Bradby, SO Kucheyev, JS Williams, J Wong-Leung, MV Swain, ...
Applied Physics Letters 80 (3), 383-385, 2002
1102002
Fe in III–V and II–VI semiconductors
E Malguth, A Hoffmann, MR Phillips
physica status solidi (b) 245 (3), 455-480, 2008
1072008
Contact-induced defect propagation in ZnO
JE Bradby, SO Kucheyev, JS Williams, C Jagadish, MV Swain, P Munroe, ...
Applied physics letters 80 (24), 4537-4539, 2002
1042002
Direct experimental evidence for the role of oxygen in the luminescent properties of GaN
M Toth, K Fleischer, MR Phillips
Physical Review B 59 (3), 1575, 1999
1031999
Structural and electronic properties of Fe 3+ and Fe 2+ centers in GaN from optical and EPR experiments
E Malguth, A Hoffmann, W Gehlhoff, O Gelhausen, MR Phillips, X Xu
Physical Review B 74 (16), 165202, 2006
992006
Depth profiling of GaN by cathodoluminescence microanalysis
K Fleischer, M Toth, MR Phillips, J Zou, G Li, SJ Chua
Applied physics letters 74 (8), 1114-1116, 1999
761999
Nanostructure fabrication by ultra-high-resolution environmental scanning electron microscopy
M Toth, CJ Lobo, WR Knowles, MR Phillips, MT Postek, AE Vladár
Nano letters 7 (2), 525-530, 2007
692007
Carrier recombination near threading dislocations in GaN epilayers by low voltage cathodoluminescence
N Pauc, MR Phillips, V Aimez, D Drouin
Applied physics letters 89 (16), 161905, 2006
662006
Cathodoluminescence microcharacterisation of silicon dioxide polymorphs
MAS Kalceff, MR Phillips, AR Moon, W Kalceff
Cathodoluminescence in geosciences, 193-224, 2000
662000
Monte Carlo modeling of cathodoluminescence generation using electron energy loss curves
M Toth, MR Phillips
Scanning: The Journal of Scanning Microscopies 20 (6), 425-432, 1998
661998
Blue shift in the luminescence spectra of MEH-PPV films containing ZnO nanoparticles
C Ton-That, MR Phillips, TP Nguyen
Journal of Luminescence 128 (12), 2031-2034, 2008
632008
P-type β-gallium oxide: a new perspective for power and optoelectronic devices
E Chikoidze, A Fellous, A Perez-Tomas, G Sauthier, T Tchelidze, ...
Materials Today Physics 3, 118-126, 2017
612017
Dissociation of H-related defect complexes in Mg-doped GaN
O Gelhausen, MR Phillips, EM Goldys, T Paskova, B Monemar, ...
Physical Review B 69 (12), 125210, 2004
612004
Phonon deformation potentials in wurtzite GaN and ZnO determined by uniaxial pressure dependent Raman measurements
G Callsen, JS Reparaz, MR Wagner, R Kirste, C Nenstiel, A Hoffmann, ...
Applied Physics Letters 98 (6), 061906, 2011
532011
Atomic layer deposition of thin films of ZnSe—structural and optical characterization
E Guziewicz, M Godlewski, K Kopalko, E Łusakowska, E Dynowska, ...
Thin Solid Films 446 (2), 172-177, 2004
522004
The system can't perform the operation now. Try again later.
Articles 1–20