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Mauricio Altieri Scarpato
Mauricio Altieri Scarpato
GPU Silicon Design Engineer at Qualcomm
Verified email at qti.qualcomm.com
Title
Cited by
Cited by
Year
HETA: Hybrid error-detection technique using assertions
JR Azambuja, M Altieri, J Becker, FL Kastensmidt
IEEE Transactions on Nuclear Science 60 (4), 2805-2812, 2013
482013
A fault tolerant approach to detect transient faults in microprocessors based on a non-intrusive reconfigurable hardware
JR Azambuja, S Pagliarini, M Altieri, FL Kastensmidt, M Hubner, J Becker, ...
IEEE Transactions on Nuclear Science 59 (4), 1117-1124, 2012
352012
Body Bias usage in UTBB FDSOI designs: A parametric exploration approach
D Puschini, J Rodas, E Beigne, M Altieri, S Lesecq
Solid-State Electronics 117, 138-145, 2016
182016
Evaluating the efficiency of software-only techniques to detect SEU and SET in microprocessors
JR Azambuja, F Sousa, L Rosa, FL Kastensmidt
arXiv preprint arXiv:2309.16876, 2023
172023
Digital circuit performance estimation under PVT and aging effects
MA Scarpato
Université Grenoble Alpes, 2017
162017
Evaluating the efficiency of data-flow software-based techniques to detect SEEs in microprocessors
JR Azambuja, A Lapolli, M Altieri, FL Kastensmidt
2011 12th Latin American Test Workshop (LATW), 1-6, 2011
112011
Coupled voltage and frequency control for dvfs management
M Altieri, W Lombardi, D Puschini, S Lesecq
2013 23rd International Workshop on Power and Timing Modeling, Optimization …, 2013
92013
Towards on-line estimation of BTI/HCI-induced frequency degradation
M Altieri, S Lesecq, E Beigne, O Heron
2017 IEEE International Reliability Physics Symposium (IRPS), CR-6.1-CR-6.6, 2017
72017
Multivariable voltage and frequency control for DVFS management
W Lombardi, M Altieri, Y Akgul, D Puschini, S Lesecq
2014 IEEE Conference on Control Applications (CCA), 2028-2033, 2014
72014
Non intrusive hybrid signature-based technique to detect seu and set faults in microprocessors
J Azambuja, M Altieri, F Kastensmidt, M Hübner, J Becker
11th European Conference on Radiation and Its Effects on Components and …, 2010
72010
Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor
M Altieri, S Lesecq, D Puschini, O Heron, E Beigne, J Rodas
2015 25th International Workshop on Power and Timing Modeling, Optimization …, 2015
42015
Advanced 3d Design and Technologies for 3-Layer Smart Imager
P Vivet, L Arnaud, S Borel, N Bresson, M Assous, S Nicolas, G Mauguen, ...
2022 International Symposium on VLSI Technology, Systems and Applications …, 2022
32022
On-silicon validation of a benchmark generation methodology for effectively evaluating combinational cell library design
M De Carvalho, M Altieri, L Puricelli, P Butzen, RP Ribas, E Fabris
2016 17th Latin-American Test Symposium (LATS), 135-140, 2016
32016
Improving error detection capability of a SpaceWire router IP
J Tarrillo, M Altieri, FL Kastensmidt
2011 12th European Conference on Radiation and Its Effects on Components and …, 2011
32011
Method and device for estimating circuit aging
M Altieri, S Lesecq, E Beign, O Heron
March, 2017
22017
Tracking BTI and HCI effects at circuit-level in adaptive systems
M Altieri, S Lesecq, E Beigne, O Heron, D Puschini
2016 14th IEEE International New Circuits and Systems Conference (NEWCAS), 1-4, 2016
22016
Using dynamic partial reconfiguration to detect sees in microprocessors through non-intrusive hybrid technique
JR Azambuja, S Pagliarini, M Altieri, FL Kastensmidt, M Hübner, J Becker
Proceedings of the 24th symposium on Integrated circuits and systems design …, 2011
22011
Energy-efficient control through power mode placement with discrete DVFS and Body Bias
Y Akgul, D Puschini, L Vincent, M Altieri, P Benoit
2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS), 1-4, 2015
12015
Early estimation of aging in the design flow of integrated circuits through a programmable hardware module
C Sandionigi, M Altieri, O Heron
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2017
2017
Non-intrusive reconfigurable HW/SW fault tolerance approach to detect transient faults in microprocessor systems
JR Azambuja, S Pagliarini, M Altieri, FL Kastensmidt, M Hübner, J Becker, ...
2011 12th European Conference on Radiation and Its Effects on Components and …, 2011
2011
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