Ender YILMAZ
Ender YILMAZ
Unknown affiliation
Verified email at asu.edu
Title
Cited by
Cited by
Year
Analog layout generator for CMOS circuits
E Yilmaz, G▄ Dundar
IEEE Transactions on computer-aided design of integrated circuits andá…, 2008
612008
Adaptive test elimination for analog/RF circuits
E Yilmaz, S Ozev
2009 46th ACM/IEEE Design Automation Conference, 720-725, 2009
292009
Adaptive test flow for mixed-signal/RF circuits using learned information from device under test
E Yilmaz, S Ozev, KM Butler
2010 IEEE International Test Conference, 1-10, 2010
282010
Adaptive multidimensional outlier analysis for analog and mixed signal circuits
E Yilmaz, S Ozev, KM Butler
2011 IEEE International Test Conference, 1-8, 2011
252011
An industrial case study of analog fault modeling
E Yilmaz, A Meixner, S Ozev
29th VLSI Test Symposium, 178-183, 2011
252011
Fault analysis and simulation of large scale industrial mixed-signal circuits
E Yilmaz, G Shofner, LR Winemberg, S Ozev
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 565-570, 2013
212013
Per-device adaptive test for analog/RF circuits using entropy-based process monitoring
E Yilmaz, S Ozev, KM Butler
IEEE transactions on very large scale integration (VLSI) systems 21 (6á…, 2012
182012
Adaptive testing: Conquering process variations
E Yilmaz, S Ozev, O Sinanoglu, P Maxwell
2012 17th IEEE European Test Symposium (ETS), 1-6, 2012
16*2012
Adaptive-learning-based importance sampling for analog circuit DPPM estimation
E Yilmaz, S Ozev
IEEE Design & Test 32 (1), 36-43, 2014
132014
Adaptive testing: Conquering process variations
E Yilmaz, S Ozev, O Sinanoglu, P Maxwell
2012 17th IEEE European Test Symposium (ETS), 1-6, 2012
122012
Dynamic test scheduling for analog circuits for improved test quality
E Yilmaz, S Ozev
2008 IEEE International Conference on Computer Design, 227-233, 2008
122008
Defect-based test optimization for analog/RF circuits for near-zero DPPM applications
E Yilmaz, S Ozev
2009 IEEE International Conference on Computer Design, 313-318, 2009
112009
Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information
E Yilmaz, S Ozev
2012 17th IEEE European Test Symposium (ETS), 1-6, 2012
82012
Fast and accurate DPPM computation using model based filtering
E Yilmaz, S Ozev
2011 Sixteenth IEEE European Test Symposium, 165-170, 2011
82011
New layout generator for analog CMOS circuits
E Yilmaz, G Dundar
2007 18th European Conference on Circuit Theory and Design, 36-39, 2007
82007
Test application for analog/rf circuits with low computational burden
E Yilmaz, S Ozev
IEEE Transactions on Computer-Aided Design of Integrated Circuits andá…, 2012
72012
Efficient process shift detection and test realignment
E Yilmaz, S Ozev, KM Butler
IEEE Transactions on Computer-Aided Design of Integrated Circuits andá…, 2013
62013
Built-in EVM measurement for OFDM transceivers using all-digital DFT
E Yilmaz, A Nassery, S Ozev, E Acar
2009 International Test Conference, 1-10, 2009
42009
Built-in self-test for stability measurement of low dropout regulator
JW Jeong, E Yilmaz, LR Winemberg, S Ozev
2017 IEEE International Test Conference (ITC), 1-9, 2017
32017
Adaptive reduction of the frequency search space for multi-vdd digital circuits
CKH Suresh, E Yilmaz, S Ozev, O Sinanoglu
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 292-295, 2013
32013
The system can't perform the operation now. Try again later.
Articles 1–20